Wafer edge inspection

Detaljer

  • Reliable defect detection
  • 2 – 5 mm of the wafer edge
  • high resolution image processing system
  • Finds particles, cracks, scratches, point-shaped and flat defects, etching defects, crystal growth, contamination and geometry deviations
Kontakt

MICRO-EPSILON SENSOTEST AB

+46 / 8564 / 733-80

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Nedladdningar
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Prenumerera på vårt nyhetsbrev
info@micro-epsilon.se