Dimensional inspection of silicon ingots

Laser profile scanners from Micro-Epsilon are used to inspect the geometry of silicon ingots. These detect the complete geometry of the silicon rods. This allows geometrical deviations of the silicon block to be determined before separation. Ingots are often provided with orientation notches, which are necessary for the alignment of the ingots. Blue laser scanners from Micro-Epsilon are used to inspect the profile of these notches for dimensional accuracy. They record the notch profile with high accuracy.

MICRO-EPSILON SENSOTEST AB
jakob.geisler@micro-epsilon.se
+46 8 564 733 80