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Thickness and structure measurement of solar wafers

For quality monitoring after the sawing process, solar wafers require reliable thickness and structure measurement. The capacitive displacement sensors in the capaNCDT series measure reliably and with high precision. For this purpose, six capacitive…

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High-performance 3D snapshot sensor for large measuring ranges

The new surfaceCONTROL 3500-240 3D snapshot sensor expands the 3D sensor portfolio. The new sensor is used for flatness and coplanarity measurement, as well as for defect detection on large measuring objects up to 245 x 180 mm. The high-performance…

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Laser sensors replace tactile measurements

optoNCDT 1220 laser triangulation sensors from Micro-Epsilon are used for the geometrical measurement of components in test equipment. Among other things, they monitor component tolerances of series-produced plastic and aluminum die-cast parts with…

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New: High-performance micrometer for the highest requirements

The new optoCONTROL 2700 micrometer offers maximum precision for inline quality assurance. It provides a digital resolution of 10 nm and a linearity of ≤ 1 µm. It is used for diameter, gap, edge and segment measurements in industrial production…

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